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Just because it’s a standard doesn’t mean everything will work together, and this is especially evident with conflicting USB standards. David Shin, senior product marketing manager at Cadence Design Systems, explains where incompatibilities can crop up, why it’s so difficult to control the different versions, and what’s behind all this confusion.
The post
A researcher from the Okinawa Institute of Science and Technology (OIST) proposes redesigning the illumination systems and projectors used in high-NA EUV litho...
Researchers from Nagoya University, Boise State University, Korea Institute of Fusion Energy, Hitachi High-Tech Corp. and Princeton Plasma Physics Laboratory published a technical paper titled “Recent Progress in Atomic-Scale Controlled Plasma Processing.”
Abstract Excerpt:
“Atomic-scale control in plasma processing is becoming increasingly crit...
Researchers from The University of Tokyo, ETH Zurich, CISPA, and RIKEN published a technical paper titled “PuDGhost: Experimental Analysis of Computation Result Corruption in Processing-using-DRAM Operations on Real DRAM Chips and Implications for Future Systems.”
Abstract excerpt:
“We reveal PuDGhost, an interference phenomenon where a PuD oper...
Researchers from University at Buffalo-SUNY, The Ohio State University, and Lawrence Livermore National Laboratory published a technical paper titled “Coordination-Sensitive Nanoscale Analysis of Defect-Driven Phase Transformation in Si-Doped (AlxGa1−x)2O3.”
Abstract excerpt:
“Defect-driven phase instability critically influences the structural ...